In this paper we present a model for studying the three-dimensional field distribution of near-field Mie scattering. The effect of the interface where near-field is generated is included in the model. We use this model to calculate the scattered electromagnetic field distribution in various planes around a dielectric particle of different sizes under S and P polarized illumination. Integrated scattered intensity into particle's upper half-space is investigated and it is found that it exhibits morphology-dependent resonance effect when particle's radius is approaching and exceeding illumination wavelength. The model is also applied to studying the dependence of the morphology-dependent resonance on various parameters associated with near-field Mie scattering by dielectric particles.