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Title

Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection

Author(s)

Chon, James W. M.;  Gu, Min;  Bullen, Craig;  Mulvaney, Paul

Abstract

We present two-photon fluorescence near-field microscopy based on an evanescent field focus produced by a ring beam under total internal reflection. The evanescent field produced by this method is focused by a high-numerical-aperture objective, producing a tightly confined volume that can effectively induce two-photon excitation. The imaging system is characterized by the two-photon-excited images of the nanocrystals, which show that the focused evanescent field is split into two lobes because of the enhancement of the longitudinal polarization component at the focus. This feature is confirmed by the theoretical prediction. Unlike other two-photon near-field probes, this method does not have the heating effect and requires no control mechanism of the distance between a sample and the probe.

Publication type

Journal article

Research centre

Swinburne University of Technology. School of Biophysical Science and Electrical Engineering

Source

Optics Letters, Vol. 28, no. 20 (Oct 2003), pp. 1930-1932

Publication year

2003

Keyword(s)

Imaging systems : Microscopy;  Fluorescence microscopy;  Scanning microscopy;  Multiphoton processes

Publisher

Optical Society of America

ISSN

0146-9592

Publisher URL

http://dx.doi.org/10.1364/OL.28.001930

Copyright

Copyright © 2003 Optical Society of America. Published version of the paper reproduced here in accordance with the copyright policy of the publisher.

Full text

Peer reviewed