Laser trapping and manipulation under focused evanescent wave illumination

Search Swinburne Research Bank

Home

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/119

Download PDF (Published version) (Adobe Acrobat PDF, -1 bytes)

Title: Laser trapping and manipulation under focused evanescent wave illumination
Author(s): Gu, Min; Haumonte, Jean-Baptiste; Micheau, Yoan; Chon, James W. M.; Gan, Xiaosong
Abstract: Laser trapping is based on the radiation pressure on a small particle in the focal region of a high numerical-aperture objective. Currently, the focal spot of a trapping beam is elongated along the longitudinal direction and thus the axial size of the trapping volume is approximately three times larger than that in the transverse direction. We report on a laser trapping technique under focused evanescent wave illumination. Therefore laser trapping of micro/nano-objects can be achieved in the near-field region with an axial trapping size of approximately 60 nm, which is reduced by approximately one order of magnitude. Hence, this technique is of significant importance in nanometry including single molecule detection and manipulation.
Publication type: Journal article
Research centre: Swinburne University of Technology. Faculty of Engineering and Industrial Sciences
Source: Applied physics letters, Vol. 84, no. 21 (2004), pp. 4236-4238
Publication year: 2004
Keyword(s): Radiation pressure; Nanostructured materials
Publisher: American Institute of Physics
Format: pp. 4236-4238
ISSN: 0003-6951
Publisher URL: Applied physics letters
Publisher URL: http://dx.doi.org/10.1063/1.1756200
Full text
Peer reviewed