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Title

Near-field imaging by a micro-particle: a model for conversion of evansescent photons into propagating photons

Author(s)

Ganic, Djenan;  Gan, Xiaosong;  Gu, Min

Abstract

In this letter we present a physical model, both theoretically and experimentally, which describes the mechanism for the conversion of evanescent photons into propagating photons detectable by an imaging system. The conversion mechanism consists of two physical processes, near-field Mie scattering enhanced by morphology dependant resonance and vectorial diffraction. For dielectric probe particles, these two processes lead to the formation of an interference-like pattern in the far-field of a collecting objective. The detailed knowledge of the far-field structure of converted evanescent photons is extremely important for designing novel detection systems. This model should find broad applications in near-field imaging, optical nanometry and near-field metrology.

Publication type

Journal article

Research centre

Swinburne University of Technology. Centre for Micro-Photonics

Source

Optics Express, Vol. 12, no. 22 (2004), pp. 5325-5335

Publication year

2004

Publisher

Optical Society of America

ISSN

1094-4087

Publisher URL

http://www.opticsinfobase.org/abstract.cfm?URI=oe-12-22-5325

Copyright

Copyright © 2004 Optical Society of America. Published version of the paper reproduced here in accordance with the copyright policy of the publisher. This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=oe-12-22-5325. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

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