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Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/55710
- Title
- Unambiguous x-ray phase retrieval from Fraunhofer diffraction data
- Author(s)
- Siu, Karen K.-W.; Nikulin, Andrei Yu; Wells, Peter P.; Harvey, Erol; Bigault, Thierry; Freund, Andreas K.; Ishikawa, Tetsuya
- Abstract
- Unambiguous x-ray phase retrieval from Fraunhofer diffraction data was achieved for an amorphous sample of low-molecular weight. The phase retrieval x-ray diffractometry technique was used to reconstruct the complex scattering amplitude with submicron spatial resolution. A significant refraction contrast was found even at relatively hard x-ray energies which was advantageous to minimize the radiation dosage to samples.
- Publication type
- Journal article
- Research centre
- Swinburne University of Technology. Faculty of Engineering and Industrial Sciences. Industrial Research Institute Swinburne
- Source
- Journal of Applied Physics, Vol. 93, no. 9 (May 2003), pp. 5161-5166
- Publication year
- 2003
- FOR Code(s)
- 02 Physical Sciences
- Keyword(s)
- Amorphous materials; Crystal structure; Diffraction; Inverse problems; Light refraction; Molecular weight; Phase retrieval; X-ray diffraction analysis
- Publisher
- American Institute of Physics
- ISSN
- 0021-8979
- Publisher URL
- http://dx.doi.org/10.1063/1.1565674
- Copyright
- Copyright © 2003 American Institute of Physics.
- Peer reviewed



