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Title

Scanning total internal reflection fluorescence microscopy and its applications

Author(s)

Chon, James W. M.;  Gu, Min

Abstract

Abstract not reproduced here by request of the publisher. The text is available from: http://dx.doi.org/10.1117/12.476038.

Publication type

Conference paper

Research centre

Swinburne University of Technology. School of Biophysical Sciences and Electrical Engineering. Centre for Micro-Photonics

Source

Proceedings of SPIE: 'Biomedical Applications of Micro- and Nanoengineering', Melbourne, Victoria, Australia, 16-17 December 2002 / Dan V. Nicolau (ed.), Vol. 4937, pp. 202-210

Publication year

2002

FOR Code(s)

0205 Optical Physics

Keyword(s)

Computer simulation;  Fluorescence;  Lighting;  Multiphoton excitation;  Multiphoton processes;  Nanostructured materials;  Nonlinear optics;  Scanning;  STIRFM

Publisher

SPIE

ISSN

0277-786X (series ISSN)

Publisher URL

http://dx.doi.org/10.1117/12.476038

Copyright

Copyright © 2002 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (vol. 4937, pp. 202-210), and is available from: http://dx.doi.org/10.1117/12.476038. The published version of the paper is reproduced here in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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