Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/1704

Title

Hierarchy of DNA immobilization and hybridization on poly-L-lysine using an atomic force microscopy study

Author(s)

Sawant, P.;  Watson, Gregory S.;  Nicolau, Dan Jr;  Myhra, Sverre;  Nicolau, Dan V.

Abstract

The atomic force microscopy has been used to analyze the immobilization of single stranded DNA on poly-L-lysine-coated glass and subsequent hybridization with complimentary DNA with the Z-threshold parameter and fractal analysis methods. The poly-L-lysine layer, which has a thickness of approximately 7 nm, presents nano-defects that could be critical for DNA immobilization by acting as a nucleation sites for ssDNA and subsequently for dsDNA aggregates. The Z-threshold for the dsDNA aggregates is much larger than for ssDNA, but the statistical fractal dimension is very similar, suggesting a conformal increase of the dimensions of the dsDNA aggregates mainly in the Z-direction, due to an effective ssDNA-ccDNA molecular recognition. This study demonstrates the use of fractal analysis in conjunction with the distribution of heights to evaluate the efficiency of DNA-DNA molecular recognition on surfaces and the impact of nanodefects.

Publication type

Journal article

Research centre

Swinburne University of Technology. Faculty of Engineering and Industrial Sciences

Source

Journal of Nanoscience and Nanotechnology, Vol. 5, no. 6 (2005), pp. 951-957

Publication year

2005

Publisher

American Scientific Publishers

ISSN

1533-4880

Publisher URL

http://dx.doi.org/10.1166/jnn.2005.125

Copyright

Copyright © 2005 American Scientific Publishers. The publisher does not allow institutions to archive either the published version or the accepted manuscript of the paper.

Peer reviewed