Search Swinburne Research Bank
Home
List of Titles
Study of intermixing in a GaAs/AlGaAs quantum-well structure using doped spin-on silica layers
List of Titles
Study of intermixing in a GaAs/AlGaAs quantum-well structure using doped spin-on silica layers
Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/1951
- Title
- Study of intermixing in a GaAs/AlGaAs quantum-well structure using doped spin-on silica layers
- Author(s)
- Fu, Lan; Van Der Heijden, Robert W.; Tan, Hark Hoe; Jagadish, Chennupati; Dao, Lap Van; Gal, Michael
- Abstract
- The effect of two different dopants, P and Ga, in spin-on glass (SOG) films on impurity-free vacancy disordering (IFVD) in GaAs/AlGaAs quantum-well structures has been investigated. It is observed that by varying the annealing and baking temperatures, P-doped SOG films created a similar amount of intermixing as the undoped SOG films. This is different from the results of other studies of P-doped SiO2 and is ascribed to the low doping concentration of P, indicating that the doping concentration of P in the SiO2 layer is one of the key parameters that may control intermixing. On the other hand, for all the samples encapsulated with Ga-doped SOG layers, significant suppression of the intermixing was observed, making them very promising candidates with which to achieve the selective-area defect engineering that is required for any successful application of IFVD.
- Publication type
- Journal article
- Research centre
- Swinburne University of Technology. School of Biophysical Science and Electrical Engineering
- Source
- Applied physics letters, Vol. 80, no. 7 (Feb. 2002), pp. 1171-1173
- Publication year
- 2002
- Keyword(s)
- Gallium arsenide; Aluminium compounds; Glass; III-V semiconductors; Semiconductor quantum wells; Vacancies (crystal); Annealing; Defect states
- Publisher
- American Institute of Physics
- Format
- pp. 1171-1173
- ISSN
- 0003-6951
- Publisher URL
- Applied physics letters
- Publisher URL
- http://dx.doi.org/doi:10.1063/1.1449522
- Copyright
- Copyright © 2002 American Institute of Physics. Reproduced in accordance with the copyright policy of the publisher.
- Full text

- Peer reviewed


