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Title

Atomic force microscopy: loading position dependence of cantilever spring constants and detector sensitivity

Author(s)

Vakarelski, Ivan U.;  Edwards, Scott A.;  Dagastine, Raymond R.;  Chan, Derek Y. C.;  Stevens, Geoffrey W.;  Grieser, Franz

Abstract

A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

Publication type

Journal article

Source

Review of Scientific Instruments, Vol. 78, no. 11 (Nov 2007), Article no. 116102

Publication year

2007

FOR Code(s)

0299 Other Physical Sciences;  0915 Interdisciplinary Engineering

Keyword(s)

Atomic force microscopy;  Cantilever beams;  Cantilever spring constant;  Colloidal particles;  Colloids;  Loading position;  Mathematical models;  Position measurement;  Springs (components);  V-shaped cantilevers

Publisher

American Institute of Physics

ISSN

0034-6748

Publisher URL

http://dx.doi.org/10.1063/1.2805518

Copyright

Copyright © 2007 American Institute of Physics. The published version is reproduced with the kind permission of the publisher.

Full text

Peer reviewed