Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/198643

Title

High fluence deposition of polyethylene glycol films at 1064 nm by matrix assisted pulsed laser evaporation (MAPLE)

Author(s)

Purice, A.;  Schou, J.;  Kingshott, P.;  Pryds, N.;  Dinescu, M.

Abstract

Matrix assisted pulsed laser evaporation (MAPLE) has been applied for deposition of thin polyethylene glycol (PEG) films with infrared laser light at 1064 nm. We have irradiated frozen targets (of 1 wt.% PEG dissolved in water) and measured the deposition rate in situ with a quartz crystal microbalance. The laser fluence needed to produce PEG films turned out to be unexpectedly high with a threshold of 9 J/cm2, and the deposition rate was much lower than that with laser light at 355 nm. Results from matrix assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) analysis demonstrate that the chemistry, molecular weight and polydispersity of the PEG films were identical to the starting material. Studies of the film surface with scanning electron microscopy (SEM) indicate that the Si-substrate is covered by a relatively homogenous PEG film with few bare spots.

Publication type

Journal article

Source

Applied Surface Science: incorporating proceedings of the 10th International Symposium on Electrochemical/Chemical Reactivity of Metastable Materials, Warsaw, Poland, 13-17 September 2010, Vol. 253, no. 19 (Jul 2007), pp. 7952-7956

Publication year

2007

FOR Code(s)

0204 Condensed Matter Physics;  0912 Materials Engineering

Keyword(s)

Crystal structure;  High fluence deposition;  Infrared laser light;  Infrared radiation;  Ionisation;  MAPLE;  Mass spectrometry;  Matrix assisted pulsed laser evaporation;  Polyethylene glycol films;  Polyethylene glycols;  Pulsed laser deposition;  Thin films

Publisher

Elsevier

ISSN

0169-4332

Publisher URL

http://dx.doi.org/10.1016/j.apsusc.2007.02.064

Copyright

Copyright © 2007 Elsevier B.V. All rights reserved.

Peer reviewed