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- Title
- Bacterial attachment response to nanostructured titanium surfaces
- Author(s)
- Truong, Vi Khanh; Wang, James Y.; Shurui, Wang; Malherbe, Francois; Berndt, Christopher C.; Crawford, Russell J.; Ivanova, Elena P.
- Abstract
- The effect of sub-nanometric surface roughness of Ti thin films surfaces on the attachment of two human pathogenic bacteria, Staphylococcus aureus CIP 65.8T and Pseudomonas aeruginosa ATCC 9027, was studied. A magnetron sputtering thin film deposition system was used to control the titanium thin film thicknesses of 3 nm, 12 nm and 150 nm on silicon wafers with corresponding surface roughness parameters of Rq 0.14 nm, 0.38 nm and 5.55 nm (1 m 1 m scanning area). Analysis of bacterial retention profiles showed that the bacteria responded differently changes in the Ra and Rq (Ti thin film) surface roughness parameters of a less than 1 nm, with up to 2-3 times: more cells being retained on the surface, and elevated levels of extracellular polymeric substances being secreted on the Ti thin films, in particular on the surfaces with 0.14 nm (Rq) roughness.
- Publication type
- Conference paper
- Research centre
- Swinburne University of Technology. Faculty of Life and Social Sciences
- Research centre
- Swinburne University of Technology. Faculty of Engineering and Industrial Sciences. Industrial Research Institute Swinburne
- Source
- Proceedings of the 2010 3rd International Conference on Nanoscience and Nanotechnology (ICONN 2010), Sydney, New South Wales, Australia, 22-26 February 2010, pp. 253-256
- Publication year
- 2010
- Keyword(s)
- Bacterial attachment; Sub-nanometric surface morphology; Titanium
- Publisher
- IEEE
- ISBN
- 9781424452620, 1424452627
- Publisher URL
- http://dx.doi.org/10.1109/ICONN.2010.6045205
- Copyright
- Copyright © 2010 IEEE. The published version of the paper is reproduced here in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
- Full text
- Peer reviewed
