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Title

Fabrication of 3D interconnected network of micro-channels inside silica by femtosecond irradiation and etching

Author(s)

Marcinkevicius, Andrius;  Juodkazis, Saulius;  Mizeikis, Vygantas;  Watanabe, Mitsuru;  Matsuo, Shigeki;  Nishii, Junji;  Misawa, Hiroaki

Abstract

We present, to the best of our knowledge, first demonstration of a direct three-dimensional (3D) microfabrication in the volume of silica glass. The microfabrication was carried out in two steps: i) recording 3-D patterns inside silica glass via silica damaging by focused femtosecond laser pulses (in multishot regime), and sample translation along X, Y, and Z directions, ii) etching the recorded patterns in HF based etchants. Comparative study of chemical etch rates in diluted HF, buffered HF, and a mixture of HF, H2O and HNO3 (P etch) reveals direct evidence of structural and/or stoichiometrical difference between damaged and 'fresh' silica. 3D structures consisting of submicrometer size voxels (smallest optically damaged volume element per shot) were successfully fabricated in the silica glass. The presented technique allows fabrication of 3D channels as narrow as 10 mum inside silica, with arbitrary angle of interconnection and high aspect ratio (10 mum diameter channels in a 100 mum thick silica slab). This approach allows to speed up fabrication, and the resulting 3D structures are optically transparent, which is advantageous for optical characterization (transmission, photoluminescence, Raman scattering, etc.) with spatial resolution determined by focusing optics.

Publication type

Conference paper

Source

Proceedings of SPIE: Laser Applications in Microelectronic and Optoelectronic Manufacturing VI, San Jose, United States, 22-24 January 2001 / Malcolm C. Gower, Henry Helvajian, Koji Sugioka and Jan J. Dubowski (eds.), Vol. 4274, pp. 469-477

Publication year

2001

Keyword(s)

Femtosecond microfabrication;  HF etching;  Light-induced damage threshold;  Microexplosion;  Silica

Publisher

SPIE

ISSN

0277-786X (series ISSN)

ISBN

9780819439529, 0819439525

Publisher URL

http://dx.doi.org/10.1117/12.432543

Copyright

Copyright © 2001 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (Vol. 4274), and is available from: http://dx.doi.org/10.1117/12.432543. The published version of the paper is reproduced here in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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