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Title

Sub-picosecond optical damaging of silica: time resolved measurements of light induced damage threshold

Author(s)

Juodkazis, Saulius;  Marcinkevicius, Andrius;  Watanabe, Mitsuru;  Mizeikis, Vygantas;  Matsuo, Shigeki;  Misawa, Hiroaki

Abstract

We investigate damage of purified silica {transmission band down to 160 nm) by sub-ps light pulses having a wavelength of 795 nm. Illumination by 350 fs duration pulses focused by a high numerical aperture N A = 1.35 microscope objective results in one of the lowest reported values for the single-shot bulk light-induced damage threshold (LIDT) of 5 J/cm(2), well below the critical self-focusing power in silica. We have also investigated peculiarities of damage by two coincident laser pulses (duration 440 fs) having power of about 0.5 x LIDT, and linearly cross-polarized to avoid interference effects. The reduction of LIDT in silica is demonstrated for an elevated lattice temperature T=400 K, at which the thermal linear/volume expansion coefficient has its maximum. Comparison between the LIDT values obtained from the numeric simulation and experiments demonstrates, that the critical density of optically generated free carriers corresponding to LIDT n(cr) similar or equal to 10(21) cm(-3) is reached during the first half time of the laser pulse illumination (0.2 ps).

Publication type

Conference paper

Source

Proceedings of SPIE: Laser-Induced Damage in Optical Materials 2000, Boulder, United States, 16-18 October 2000 / Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith L. Lewis and M. J. Soileau (eds.), Vol. 4347, pp. 212-222

Publication year

2001

Keyword(s)

Defects;  Light-induced damage threshold;  Silica;  Time-resolved measurements

Publisher

SPIE

ISSN

0277-786X (series ISSN)

ISBN

9780819440365, 0819440361

Publisher URL

http://dx.doi.org/10.1117/12.425013

Copyright

Copyright © 2001 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (Vol. 4347), and is available from: http://dx.doi.org/10.1117/12.425013. The published version of the paper is reproduced here in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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