Home List of Titles Modification of a commercial atomic force microscope for nanorheological experiments: adsorbed polymer layers
Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/231503
- Modification of a commercial atomic force microscope for nanorheological experiments: adsorbed polymer layers
- Notley, Shannon; Craig, Vincent S. J.; Biggs, Simon
- The atomic force microscope (AFM) has previously been applied to the measurement of surface forces (including adhesion and friction) and to the investigation of material properties, such as hardness. Here we describe the modification of a commercial AFM that enables the "stiffness" of interaction between surfaces to be measured concurrently with the surface forces. The stiffness is described by the rheological phase difference between the response of the AFM tip to a driving oscillation of the substrate. We present the interaction between silica surfaces bearing adsorbed polymer, however, the principles could be applied to a wide variety of materials including biological samples.
- Publication type
- Journal article
- Microscopy and Microanalysis, Vol. 6, no. 2 (Mar 2000), pp. 121-128
- Publication year
- FOR Code(s)
- 0204 Condensed Matter Physics; 0601 Biochemistry and Cell Biology; 0912 Materials Engineering
- Atomic force microscopy; Force modulation; Modification; Nanorheology; Phase; Polymer adsorption; Surface forces
- Cambridge University Press
- Publisher URL
- Copyright © 2000 Microscopy Society of America.
- Peer reviewed