Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/3862

Title

Scanning TIR microscopy : near-field Mie scattering and localized morphology-dependent resonance

Author(s)

Chon, James W.;  Gan, Xiaosong;  Ganic, Djenan;  Gu, Min;  Morrish, Dru

Abstract

Not supplied.

Publication type

Conference abstract

Research centre

Swinburne University of Technology. School of Biophysical Science and Electrical Engineering

Source

3rd Asia Pacific Workshop on Near Field Optics, 28 November - 1 December 2001, Melbourne, Victoria, Australia, pp. 45

Publication year

2001