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Title

BEAT: Boolean expression fault-based test case generator

Author(s)

Chen, T. Y.;  Grant, D. D.;  Lau, M. F.;  Ng, S. P.;  Vasa, Rajesh

Abstract

This paper presents a system which generates test cases from Boolean expressions. The system is based on the integration of several fault-based test case selection strategies developed by us. Our system generates test cases that are guaranteed to detect all single operator fault and all single operand faults when the Boolean expression is in irredundant disjunctive normal form. Apart from being an automated test case generation tool developed for software testing practitioners, this system can also be used as a training or self-learning tool for students as well as software testing practitioners.

Publication type

Conference paper

Research centre

Swinburne University of Technology. School of Information Technology

Source

Proceedings of the International Conference on Information Technology: Research and Education (ITRE2003), Newark, New Jersey, United States, 11-13 August 2003, pp. 625-629

Publication year

2003

Publisher

IEEE

ISSN

0780377249

Publisher URL

http://dx.doi.org/10.1109/ITRE.2003.1270695

Copyright

Copyright © 2003 IEEE. Published version of the paper reproduced here in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Full text

Peer reviewed