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Title

On the completeness of test cases for atomic arithmetic expressions

Author(s)

Chen, T. Y.;  Feng, X.;  Tse, T. H.

Abstract

Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary.

Publication type

Conference paper

Research centre

Swinburne University of Technology. School of Information Technology

Source

Proceedings of the 1st Asia-Pacific Conference on Quality Software (APAQS 2000), 30-31 October 2000, Hong Kong, China, pp. 149-155

Publication year

2000

Publisher

IEEE Computer Society

ISBN

0 7695 0825 1

Publisher URL

http://dx.doi.org/10.1109/APAQ.2000.883788

Copyright

Copyright © 2000 IEEE. Published version of the paper reproduced here in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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Peer reviewed