Home List of Titles Analysis of structured highlight stereo imaging for shape measurement of specular objects
Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/20368
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- Analysis of structured highlight stereo imaging for shape measurement of specular objects
- Graves, Kynan E.; Nagarajah, C. Romesh; Stoddart, Paul R.
- Structured highlight stereo (SHS) is a technique for the measurement of specular objects, and is based on viewing the reflection of a structured highlight pattern from multiple directions. This paper reports the results of a simulation and experimental analysis of the approach in order to further understand the accuracy and limitations of SHS. In particular, this paper describes two important findings related to this technique. Firstly, it is shown that the search region containing a consistent set of candidate highlights may be minimized using epipolar constraints. Secondly, an analysis is presented to quantify the accuracy of the SHS approach for different surface curvatures. The results indicate that, although it is possible to accurately measure the surface height of planar specular objects, the accuracy is reduced for objects with curved surface profiles. The measurement error occurs because in general it is not possible to measure the same surface location with both cameras, which then leads to an inconsistency between the surface normal estimates for each camera. The measurement error increases in relation to both the distance between measurement locations on the surface and the surface curvature.
- Publication type
- Journal article
- Research centre
- Swinburne University of Technology. Faculty of Engineering and Industrial Sciences. Centre for Atom Optics and Ultrafast Spectroscopy
- Optical Engineering, Vol. 46, no. 8 (2007)
- Publication year
- Computer vision; Object detection; Shape measurement; Specular surfaces; Stereo image processing; Stereo vision
- SPIE - International Society for Optical Engineering
- Publisher URL
- Copyright © 2007 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Optical Engineering (Vol. 46), and is available from: http://dx.doi.org/10.1117/1.2769607. The published version of the paper is reproduced here in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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