Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/41676

Title

Microstructural index to quantify thermal spray deposit microstructures using image analysis

Author(s)

Montavon, Ghislain;  Coddet, Christian;  Berndt, Christopher C.;  Leigh, Sang Ha

Abstract

The basic metallographic analysis leads to qualitative interpretation of the structural characteristics of a microstructure, for example the presence of phases, and the description of singularities such as inclusions. On the contrary, microstructural characterization which implements image analysis leads to a quantified analysis of structural characteristics. A method is described to assess thermal spray deposit microstructures using image analysis by means of a metallographic index. This index is based on the determination of several stereological and morphological parameters by primary referee to the size-shape distributions of the features, the fractal dimension of the deposit upper surface, and the Euclidean distance map of the bodies of interest. This work employs quantitative metallography on a much wider scale to provide better quality control of deposit microstructures.

Publication type

Journal article

Source

Journal of Thermal Spray Technology, Vol. 7, no. 2 (Jun 1998), pp. 229-241

Publication year

1998

Keyword(s)

Deposition;  Euclidean distance map;  Fractal dimension;  Fractals;  Image analysis;  Metallographic index;  Metallographic microstructure;  Morphology;  Quality control;  Quantitative metallography;  Sprayed coatings;  Stereology;  Thermal spraying

Publisher

Springer

ISSN

1059-9630

Publisher URL

http://dx.doi.org/10.1361/105996398770350972

Copyright

Copyright © ASM International 1998.

Peer reviewed