Search Swinburne Research Bank
Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.3/43008
- Title
- Nano-structured surfaces control bacterial attachment
- Author(s)
- Mitik-Dineva, Natasa; Wang, James; Stoddart, Paul R.; Crawford, Russell J.; Ivanova, Elena P.
- Abstract
- Surface roughness is known to play a significant role in the cell-surface attachment process, particularly when the surface irregularities are of a dimension that is comparable to the bacterial size and hence provide shelter from unfavorable environmental factors. To explore the influence of nano-scale surface roughness on bacterial attachment this study utilized asreceived and chemically treated glass surfaces as substrata for bacterial adsorption. Surface modification via chemical etching resulted in a 70% decrease in the nano-scale roughness of the glass surface with no alteration of its chemical composition. We have observed that bacteria belonging to three different taxa, while adhering to the modified surface, exhibited similar attachment tendencies to the un-modified substratum, however the number of attached cells increased threefold. The increase in extent of attachment was also associated with bacterial morphologic and metabolic changes. The results obtained suggest that nano-scale surface roughness might strongly influence bacterial attachment.
- Publication type
- Conference paper
- Research centre
- Swinburne University of Technology. Faculty of Life and Social Sciences
- Research centre
- Swinburne University of Technology. Faculty of Engineering and Industrial Sciences. Centre for Atom Optics and Ultrafast Spectroscopy
- Source
- Proceedings of the 2008 International Conference on Nanoscience and Nanotechnology (ICONN 2008), Melbourne, Australia, 25-29 February 2008, pp. 113-116
- Publication year
- 2008
- Keyword(s)
- Bacterial attchment; Glass; Nano-scale roughness
- Publisher
- IEEE
- ISBN
- 9781424415045, 1424415047
- Publisher URL
- http://dx.doi.org/10.1109/ICONN.2008.4639259
- Copyright
- Copyright © 2008 IEEE. Published version of this paper reproduced here in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
- Full text

- Peer reviewed



