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Title Authors Year Publication Type Full Text Peer Reviewed
Characterization of a subwavelength-scale 3D void structure using the FDTD-based confocal laser scanning microscopic image mapping technique Choi, Kyongsik; Chon, James W.; Gu, Min; Lee, Byoungho 2007 Journal article Full Text Full Text Peer Reviewed Peer Reviewed
Enhanced coupling to whispering gallery modes by two-photon absorption induced by a highly focused field Kuriakose, Smitha; Morrish, Dru; Gan, Xiaosong; Chon, James W.; Gu, Min 2006 Journal article Full Text Full Text Peer Reviewed Peer Reviewed
Environment-dependent blinking of single semicondutor nanocrystals and statistical aging of ensembles Verberk, R.; Chon, James W.; Gu, Min; Orrit, M. 2005 Journal article Peer Reviewed Peer Reviewed
Optical lifting force under focused evanescent wave illumination: a ray optics model Chon, James W.; Gan, Xiaosong; Gu, Min; Kuriakose, Smitha 2005 Journal article Full Text Full Text Peer Reviewed Peer Reviewed
Recent progress in multi-dimensional bit optical data storage Chon, James W.; Gu, Min 2004 Conference poster
Scanning TIR microscopy : near-field Mie scattering and localized morphology-dependent resonance Chon, James W.; Gan, Xiaosong; Ganic, Djenan; Gu, Min; Morrish, Dru 2001 Conference abstract
Scanning total internal reflection microscopy using an objective of NA=1.65 Chon, James W.; Gan, Xiaosong; Gu, Min 2001 Conference abstract
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