Atomic force microscopy: loading position dependence of cantilever spring constants and detector sensitivity

Author(s)

Vakarelski, Ivan U.; Edwards, Scott A.; Dagastine, Raymond R.; Chan, Derek Y. C.; Stevens, Geoffrey W.; Grieser, Franz

Available versions

Abstract

A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

Publication year

2007

Publication type

Journal article

Source

Review of Scientific Instruments, Vol. 78, no. 11 (Nov 2007), article no. 116102

ISSN

0034-6748

Publisher

American Institute of Physics

Copyright

Copyright © 2007 American Institute of Physics. The published version is reproduced with the permission of the publisher.

Details